Combining data comparison with DRC method! Significantly reduce work costs by shortening confirmation time through high-speed scanning and low false alarm rate.
The "EAGLE F Series Film AOI" can simultaneously inspect PCB films and diazo films.
Thanks to data comparison and DRC principles, it is capable of high-precision and efficient inspection of film opens/shorts, chips, protrusions, white pins, black pins, L/S violations, extra patterns, omissions, and special defects.
Additionally, it is equipped with features such as 2D length measurement (OP) and SPC defect statistical analysis for "Statistical Process Control."
【Features】
■ A genuine product for PCB films that combines data comparison and DRC methods
■ Offers performance superior to typical domestic data comparison AOIs at a high cost-performance ratio
■ Reduces inspection time and significantly lowers operational costs through high-speed scanning and low false alarm rates
■ Capable of equipping L/S and two-point length measurement functions (OP) as well as SPC defect statistical analysis functions
*For more details, please refer to the PDF documentation or feel free to contact us.